CalibratAR Micro Scale 3D Calibration Reference
AFM/SPM calibration standards and standard samples for calibrating AFM.
The CalibratAR calibration reference can be used for various purposes such as the evaluation and calibration of diverse microscopes. Its applications range widely, including scanning probe microscopes, atomic force microscopes, electron microscopes, optical microscopes, and even stylus and optical profilers. For three-dimensional evaluation, the reference sample design incorporates shapes in three orthogonal directions.
- 企業：オックスフォード・インストゥルメンツ
- 価格：Other
